The MT29F256G08CBCBBJ4-37:B belongs to the category of NAND flash memory.
This product is primarily used for data storage in various electronic devices such as smartphones, tablets, digital cameras, and solid-state drives (SSDs).
The MT29F256G08CBCBBJ4-37:B is typically packaged in a surface-mount ball grid array (BGA) package. Each package contains one unit of the NAND flash memory.
The MT29F256G08CBCBBJ4-37:B has a total of 48 pins. The pin configuration is as follows:
The MT29F256G08CBCBBJ4-37:B operates based on the principles of NAND flash memory technology. It utilizes a grid of memory cells, each capable of storing multiple bits of data. These cells are organized into pages and blocks, with each page typically containing several kilobytes (KB) of data. The memory cells store data by trapping electric charges within their floating gates.
To read data, the memory controller applies appropriate voltages to the selected memory cells, allowing the charge levels to be sensed and converted into digital data. Programming involves applying specific voltage levels to program the desired charge states
Question: What is the capacity of the MT29F256G08CBCBBJ4-37:B?
Answer: The MT29F256G08CBCBBJ4-37:B has a capacity of 256 gigabits (32 gigabytes).
Question: What is the operating voltage range for this memory device?
Answer: The operating voltage range for the MT29F256G08CBCBBJ4-37:B is typically between 2.7V and 3.6V.
Question: What is the interface used by this memory device?
Answer: The MT29F256G08CBCBBJ4-37:B uses a standard NAND flash interface.
Question: What is the maximum data transfer rate supported by this memory device?
Answer: The MT29F256G08CBCBBJ4-37:B supports a maximum data transfer rate of up to 400 megabytes per second.
Question: Can this memory device be used in industrial applications?
Answer: Yes, the MT29F256G08CBCBBJ4-37:B is designed for industrial-grade applications and can withstand harsh environments.
Question: Does this memory device support wear-leveling algorithms?
Answer: Yes, the MT29F256G08CBCBBJ4-37:B supports wear-leveling algorithms to ensure even distribution of write/erase cycles across the memory cells.
Question: What is the typical endurance rating for this memory device?
Answer: The MT29F256G08CBCBBJ4-37:B has a typical endurance rating of 10,000 program/erase cycles per block.
Question: Is this memory device compatible with existing NAND flash controllers?
Answer: Yes, the MT29F256G08CBCBBJ4-37:B is designed to be compatible with standard NAND flash controllers.
Question: Can this memory device operate in a wide temperature range?
Answer: Yes, the MT29F256G08CBCBBJ4-37:B is rated for operation in temperatures ranging from -40°C to 85°C.
Question: What is the package type of this memory device?
Answer: The MT29F256G08CBCBBJ4-37:B comes in a standard BGA (Ball Grid Array) package.